IEEE Std 671-1985 IEEE Standard Specification Format Guide and Test Procedure for Non-gyroscopic Inertial Angular Sensors Jerk, Acceleration, Velocity, and Displacement.pdf

_ © Copyright 1985 by The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017, USA No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 671-1985 (R2008) IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and Displacement Sponsor Gyro and Accelerometer Panel of the IEEE Aerospace Electronic Systems Society Reaffirmed 19 June 2003 Approved 6 May 1992 American National Institute Reaffirmed 10 December 2008 Approved 23 June 1983 IEEE-SA Standards Board Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 10:22:46 UTC from IEEE Xplore. Restrictions apply. 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Restrictions apply. iii Foreword (This Foreword is not a part of IEEE Std 671-11985, IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and Displacement.) This standard was prepared by the Gyro and Accelerometer Panel of the Aerospace and Electronic Systems Society of the Institute of Electrical and Electronics Engineers. It is a guide for the preparation of a specification and test procedure for an inertial angular sensor. It is intended to provide a common meeting ground of terminology and practice for manufacturers and users of an array of sensors which have been developed to meet needs not easily met by traditional spinning rotor gyroscopes. These needs have included greater dynamic range, lower noise, lower power, longer service life, and greater ruggedness. To cover this variety, the standard is written in black box input versus output terms which could be applied to any inertial angular sensor, including laser and conventional gyroscopes. It is not intended to compete with existing standards for specific devices with highly specific models and error sources, such as spring restrained rate gyros. Rather, the standard is to provide a uniform guide for those inertial angular sensors which have not been covered elsewhere. The sensors described may have analog or digital outputs and may measure angular jerk, acceleration, rate or displacement with or without response down to zero frequency. This standard consists of a main text and three appendixes. The main text is a specification format guide and test procedure for inertial angular sensors. The specification format guide is intended to provide a common format for manufacturers and users in the preparation of an angular sensor specification. The test procedure is intended to provide a means of verifying that the specifications have indeed been met. Appendix A is a compilation of block diagrams characterizing the dynamic response of several types of inertial angular sensors. Appendix B describes the modifications of some of the tests of this standard which are necessary to accommodate sensor classes other than the sensor which is used as an example in this standard, or for those sensors which have unusual error sources requiring specialized testing. The special problems and techniques of dynamic angular testing is also discussed in Appendix B. Appendix C discusses some of the necessary accommodations which shall be made to the described tests of this standard when testing sensors with digital, rather than analog, outputs. The user is cautioned not to overspecify; only those parameters that are required to guarantee proper performance in the specific application should be controlled. In general, the specification should contain only those requirements that can be verified by test or inspection. Parameters in addition to those given in this format are not precluded. Blank spaces permit the insertion of specific parameter values and their tolerances. Brackets are used to enclose alternate choices of dimensional units, signs, axes, etc. The choices shown are the recommended options, but are not meant to include all possibilities. Boxed statements are included for information only and are not part of the specification format. The figures presented are to be used as a guide for the preparation of specific figures or drawings. The terminology used conforms to ANSI/IEEE Std 100-1984, IEEE Standard Dictionary of Electrical and Electronics Terms and IEEE Std 528-1984, IEEE Standard Inertial Sensor Terminology. The units used conform to ANSI/IEEE Std 268-1982, American National Standard Metric Practice. In this standard, the symbol g is used to denote a unit of acceleration equal in magnitude to the local value of gravity at the test site or other specified value of gravity. This symbol is thus distinguished from g which is the standard symbol for gram. Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 10:22:46 UTC from IEEE Xplore. Restrictions apply. iv This publication represents a group effort on a large scale. The major contributors to this standard were as follows: J. F. Conroy, Chair R. F. Asmar C. E. Bosson A. T. Campbell J. W. Davies H. B. Diamond R. H. Fall A. H. Ferraris T. A. Fuhrman K. N. Green R. E. Hartzell M. G. Koning E. L. Ladenheim T. C. Lear D. R. Morris H. D. Morris G. E. Morrison G. C. Murray* D. F. Nieman R. B. Peters S. C. Piccione M. J. Rupert W. F. Sapp B. Schwartz A. E. Scoville N. F. Sinnott C. O. Swanson* G. R. Taylor B. J. Wimber *Former Chairman When the IEEE Standards Board approved this standard on June 23, 1983, it had the following membership: James H. Beall, Chair Edward Chelotti, Vice Chair Sava I. Sherr, Secretary J. J. Archambault John T. Boettger J. V. Bonucchi Rene Castenschiold Edward J. Cohen Len S. Corey Donald C. Fleckenstein Jay Forster Donald N. Heirman Irvin N. Howell Joseph L. Koepfinger* Irving Kolodny George Konomos R. F. Lawrence John E. May Donald T. Michael* John P. Riganati Frank L. Rose Robert W. Seelbach Jay A. Stewart Clifford O. Swanson Robert E. Weiler W. B. Wilkens Charles J. Wylie *Member emeritus. Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 10:22:46 UTC from IEEE Xplore. Restrictions apply. v CLAUSEPAGE 1. Scope.1 2. Applicable Documents1 2.1 Specifications. 2 2.2 Standards 2 2.3 Drawings 2 2.4 Other Publications 2 3. Requirements 3 3.1 General. 3 3.2 Description. 3 3.3 Performance . 9 3.4 Environmental Requirements. 16 3.5 Reliability. 20 4. Quality Assurance.20 4.1 Verification Methods . 20 4.2 Acceptance Tests 21 4.3 Qualification Tests. 24 4.4 Reliability Tests . 24 4.5 Standard Test Conditions. 24 4.6 Test Equipment 25 4.7 Test Methods 25 4.8 Data Submittal 48 5. Preparation for Delivery48 6. Notes .48 6.1 Intended Use 48 6.2 Ordering Data. 49 6.3 Model Equation 49 7. Definitions.49 Annex A (Informative) Sensor Dynamic Block Diagrams.51 Annex B (Informative) Notes on Dynamic Testing of Inertial Angular Sensors .53 Annex C (Informative) Digital Sensors and Some Comments Concerning Their Test Methods.65 Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 10:22:46 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 10:22:46 UTC from IEEE Xplore. Restrictions apply. Copyright © 1985 IEEE All Rights Reserved1 IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and Displacement 1. Scope This standard defines the requirements and test procedures for a single, multi- axis nongyroscopic angular jerk, acceleration, velocity, displacement sensor. The output is an analog electrical signal, a digital electrical pulse train proportional to angular jerk, acceleration, velocity, displacement. The electronics are to be considered part of the sensor to the extent specified herein. All parameters specified in this standard refer to the overall sensor output unless otherwise specified. The device will hereafter be referred to as the sensor. 2. Applicable Documents The following documents of the issue in effect on the date of invitation for bids or request for proposal form a part of the specification to the extent specified herein. In the event of any conflict between the requirements of this standard and the listed documents, the requirements of this standard shall govern. In some instances, the sensor mechanism and the electronics may be housed in separate packages. In these cases, the term sensor may be reserved for the mechanism, while the overall device is called the transducer, accelerometer, etc. Give identification number, title, date of issue, and revision letter of each listed document. Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 10:22:46 UTC from IEEE Xplore. Restrictions apply. 2Copyright © 1985 IEEE All Rights Reserved IEEE Std 671-1985IEEE STANDARD SPECIFICATION FORMAT GUIDE AND TEST 2.1 Specifications 2.1.1 Government 2.1.2 Industry/Technical 2.1.3 Company 2.2 Standards 2.2.1 Government 2.2.2 Industry/Technical 2.2.2.1 ANSI/IEEE Std 100-1984, IEEE Standard Dictionary of Electrical and Electronics Terms.1 2.2.2.2 IEEE Std 528-1984, IEEE Standard Inertial Sensor Terminology. 2.2.3 Company 2.3 Drawings 2.3.1 Government 2.3.2 Industry/Technical 2.3.3 Company 2.4 Other Publications 1These documents are available from the Sales Department, IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854. They are also available from the Sales Department, American National Standards Institute, 1430 Broadway, New York, NY 10018. The units and symbols used in this standard comply with: ANSI/IEEE Std 260-1978 (R1985), IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units) ANSI/IEEE Std 268-1982, IEEE Standard Metric Practice ANSI/IEEE Std 315-1975, IEEE Standard Graphic Symbols for Electrical and Electronics Diagrams Other applicable documents should be listed under the appropriate categories. Authorized licensed use limited to: IEEE Standards Staff. Downloaded on January 27, 2009 at 15:01 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: Tsinghua University Library. Downloaded on December 25,2010 at 10:22:46 UTC from IEEE Xplore. Restrictions apply. Copyright © 1985 IEEE All Rights Reserved3 PROCEDURE FOR NONGYROSCOPIC INERTIAL ANGULAR SENSORSIEEE Std 671-1985 3. Requirements 3.1 General 3.1.1 Precedence In the event of conflict among the purchase agreement, this standard, and other documents referred to herein, the order of precedence shall be as follows: 1)The purchase agreement 2)This standard and its applicable drawings 3)Other applicable documents 3.1.2 Other List other applicable general requirements. 3.2 Description The angular jerk, acceleration, velocity, displacement sensor is a single, multi- axis, nongyroscopic device which provides an analog electrical signal, a digital electrical pulse rate proportional to angular jerk, acceleration, velocity, displacement, and associated electronics as shown in Fig 1. 3.2.1 Mechanical and Thermal Design The following mechanical and thermal requirements apply to sensor package(s) to the extent specified. 3.2.1.1 Exterior Surface All exterior surfaces shall withstand the environment specified herein and the handling expected in the normal course of operation, testing, and maintenance without de