ANSI-INCITS-322-2008.pdf

American National Standard Developed by for Information Technology Card Durability Test Methods ANSI INCITS 322-2008 ANSI INCITS 322-2008 Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- ANSI INCITS 322-2008 Revision of ANSI INCITS 322-2002 ® American National Standard for Information Technology Card Durability Test Methods Secretariat Information Technology Industry Council Approved July 30, 2008 American National Standards Institute, Inc. Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- Approval of an American National Standard requires review by ANSI that the requirements for due process, consensus, and other criteria for approval have been met by the standards developer. Consensus is established when, in the judgement of the ANSI Board of Standards Review, substantial agreement has been reached by directly and materially affected interests. Substantial agreement means much more than a simple majority, but not necessarily unanimity. Consensus requires that all views and objections be considered, and that a concerted effort be made towards their resolution. 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Purchasers of American National Standards may receive current information on all standards by calling or writing the American National Standards Institute. American National Standard Published by American National Standards Institute, Inc. 25 West 43rd Street, New York, NY 10036 Copyright © 2008 by Information Technology Industry Council (ITI) All rights reserved. No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without prior written permission of ITI, 1250 Eye Street NW, Washington, DC 20005. Printed in the United States of America CAUTION: The developers of this standard have requested that holders of patents that may be required for the implementation of the standard disclose such patents to the publisher. However, neither the developers nor the publisher have undertaken a patent search in order to identify which, if any, patents may apply to this standard. 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Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- i Contents Page Foreword.iv 1Scope . 1 2Normative References 1 3Default Test Environment and Conditioning. 2 4Definitions. 3 5Test Methods 4 5.1Peel Strength - 180° peel angle 4 5.2Peel Strength - 90° peel angle 7 5.3Adhesion Crosshatch Tape Test 10 5.4ID-1 Card Flexure. 13 5.5ID-1 Card Static Stress. 16 5.6ID-1 Card Stress and Plasticizer Exposure 19 5.7Impact Resistance 21 5.8Elevated Temperature and Humidity Exposure . 24 5.9Surface Abrasion . 25 5.10 Bar Code Abrasion (1D). 27 5.11 Magnetic Stripe Abrasion . 29 5.12 Image Abrasion . 31 5.13 Temperature- and Humidity-Induced Dye Migration. 33 5.14 Plasticizer Induced Dye Migration 36 5.15 Ultraviolet (UV) Light Exposure 38 5.16 Daylight Exposure Image Stability - Xenon Arc 39 5.17 Laundry Test. 41 5.18 Embossed Character Retention - Pressure 42 5.19 Embossed Character Retention - Heat. 45 5.20 Corner Impact Test. 47 5.21 Wet Abrasion Test 49 5.22 IC Card with Contacts Micromodule Adhesion. 50 5.23 Water Soak Test. 52 5.24 Linear Dimensional Change at Elevated Temperature. 53 5.25 Three Roller IC Card Test 55 5.26 Hole Tear Test 57 Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- ii Page 6Test Sequences . 59 6.1Card Structure Integrity Test Sequence. 59 6.2Card Flexure and Peel Strength Sequence 60 6.3Elevated Temperature/Humidity and Peel Strength Sequence 61 6.4Wet Abrasion and Peel Strength Sequence. 62 6.5Card Flexure, Wet Abrasion and Peel Strength Sequence 63 6.6Ultraviolet Light Exposure and Corner Impact Sequence. 64 Annex A Bibliography 65 Tables 1Rating Diagrams. 12 2Full flex dimensions 13 Figures 1 Card preparation . 5 2 Card preparation (Alternative) 5 3 Card preparation for peel test. 6 4 Card mounted in tensile tester . 6 5 Examples of peel strength chart recordings. 6 6 Card mounted in tensile tester . 9 7 Tape peel angle 10 8 Full flex condition 13 9 Cross section - calibration plate . 13 10 Jaw details . 13 11 Calibration plate inside jaws. 13 12Card orientation 14 13Stress fixture - Axis A. 16 14Stress fixture - Axis B. 16 15 Card impact fixture . 18 16 Impact Test Data Point example 22 17 Impact apparatus 23 18 Test card notch location . 26 19 1D Bar code test location (abrasion) 28 20Mag stripe read area and hole location 30 21 Image test location . 32 22 Temp/humidity dye migration test pattern 34 Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- iii Page 23 Bar code print location37 24 Guage collar .42 25 Embossed character height guage.43 26 Embossed character test locations.43 27 Card corner impact fixture 48 28 Paint shaker49 29 Micromodule adhesion fixture.51 30Three roller arrangement55 31Hook diagram .57 32Card mounted for hole tear.58 Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- iv Foreword(This foreword is not part of American National Standard ANSI INCITS 322-2008.) This standard provides an agreed upon set of test methods that contain specific pro- cedures to be followed. The acceptance or rejection criteria of identification cards, based on test results from these durability test methods, are not within the scope of work of this standard. The precision and bias of test results obtained from a given test method are influ- enced by a host of variables. The major sources of this variation are contributed by test method, test design, operator, measurement technique, equipment, calibration, environment and materials variation. Round robin test results from many of the test methods are available upon request. The test method development has attempted to minimize the variation that the test methods might contribute. The test design should consider randomization of test ma- terials, replication and the skillful grouping of test materials. Each operator must be diligent in the use of good testing practices in order to minimize the operator's contri- butions to the test variability. Durability acceptance criteria as stated in ISO/IEC 7810 3rd edition - 2003 Physical characteristics - subclause 8.7: “Durability of the card is not established in this International Standard. It is based on a mu- tual agreement between the card issuer and the supplier.“ Accord- ingly, the card issuer and supplier need to agree to which durability test method, contained herein, is relevant for the given card applica- tion. INCITS B10.3 Task Force on Card Durability Test Methods has established the fol- lowing process steps for generating this standard: Step 1: Identify existing ID card durability problems experienced in field perfor- mance. Step 2: Identify potential test methods that relate to the durability concern. Step 3: Select a team leader, with other experts, to coordinate proposed test methods in given categories (i.e. abrasion resistance, Peel Strength, and ad- hesion). Step 4: Present new Test Method for consideration. (A simple read-through of the test method proposal in ISO 10373 format.) Step 5: Task Force discussion of the proposal. Determination of whether it 'fits' within the Scope of Work. Step 6: Proposal is given 'Pending Status' for determination at the next meeting. At the next meeting the proposal is either 'Accepted in Principal' or rejected. If accepted, the proposal is incorporated into the working paper for further dis- cussion and possible modification at succeeding meetings. Step 7: Testing is conducted and results reported to 'validate' the test technique and/or to resolve technical issues. Step 8: The Test Method status becomes 'Accepted for Publication' after all is- sues have been resolved. Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- v These test methods may suggest use of materials or test equipment, which are trade-names of a product supplied by a specific manufac- turer. This information is given for the convenience of users of this ANSI standard and does not constitute an endorsement by ANSI or INCITS of the product named. Equivalent products may be used if they can be shown to lead to the same result This standard was developed by Technical Committee B10 of Accredited Stan- dards Committee INCITS during 2002 - 2006. The standards approval process started in 2006. This document includes annexes that are informative and are not considered part of the standard. Requests for interpretation, suggestions for improvements or addenda, or defect re- ports are welcome. They should be sent to the INCITS Secretariat, Information Technology Industry Council, 1250 Eye Street, NW, Suite 200, Washington, DC 20005-3922. The standards was processed and approved for submittal to ANSI by the Internation- al Committee for Information Technology Standards (INCITS). Committee approval of the standard does not necessarily imply that all committee members voted for its approval. At the time it approved this standard, INCITS had the following members: Karen Higginbottom, Chair Jennifer Garner, Secretary Organization Represented Name of Representative Adobe Systems, IncSteve Zilles Scott Foshee (Alt.) AIM Global Dan Mullen Charles Biss (Alt.) Apple Computer, Inc. David Michael Distributed Managment Task ForceTony DiCenzo Electronic Industries AllianceEdward Mikoski, Jr. EMC Corporation Gary Robinson Farance, IncFrank Farance Timothy Schoechle (Alt.) Google Zaheda Bhorat GS1 US.Ray Delnicki Frank Sharkey (Alt.) James Chronowski (Alt.) Mary Wilson (Alt.) Hewlett-Packard Company .Karen Higginbottom Steve Mills (Alt.) Scott Jameson (Alt.) IBM CorporationRonald F. Silletti Robert Weir (Alt.) Sandy Block (Alt.) Richard Schwerdtfeger (Alt.) IEEEJudith Gorman Terry DeCourcelle (Alt.) Bill Ash (Alt.) Jodi Haasz (Alt.) Bob Labelle (Alt.) Susan Tatiner (Alt.) Intel .Philip Wennblom Dave Thewlis (Alt.) Grace Wei (Alt.) Lexmark International .Don Wright Dwight Lewis (Alt.) Paul Menard (Alt.) Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license from IHS -,-,- vi Organization RepresentedName of Representative Microsoft Corporation. Jim Hughes Dave Welsh (Alt.) Isabelle Valet-Harper (Alt.) National Institute of Standards - Length and axis of fracture; - Description of which card side the fracture occurred; - Full description of card design features (printing, IC, photo, mag stripe, embossing, etc.). 5.4.5 Precision and Bias 5.4.5.1 Interlaboratory Test Program An interlaboratory study of ID-1 Card Flexure was run in 1998. Sixteen sets of samples were run by four different laboratories. 5.4.5.2 Test Results The precision information given below in the units of measurement (flex cycles until failure) is for the comparison of twelve test results for each laboratory, each of which is the average of six test determinations. 5.4.5.3 Precision 95% confidence interval (cycles) 99% confidence interval (cycles) Repeatability limit (within laboratory) ±5300 ±7000 Reproducibility limit (among laboratories) ±6800 ±9000 Test measurement tolerance (overall) ±8700 ±11000 The above terms (repeatability limit and reproducibility limit) are used as specified in ASTM Practice E177-04e1. The respective standard deviations among test results may be obtained by dividing the values in the 95% confidence interval column by 1.96 or by dividing the values in the 99% confidence interval column by 2.57. 5.4.5.4 Bias No statement of bias can be made for this test method because there is no accepted reference material or absolute test method for use as a comparison basis. 15 Copyright American National Standards Institute Provided by IHS under license with ANSI Licensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:09:42 MSTNo reproduction or networking permitted without license