BS-9940-01.01-1983 IEC-60115-2-1-1982 QC-400101-1982.pdf

BRITISH STANDARD BS 9940-01.01: 1983 IEC 115-2-1: 1982 QC 400101: 1982 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Fixed resistors for use in electronic equipment Fixed low power non-wirewound resistors Assessment level E Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 © BSI 12-1999 ISBN 0 580 54151 8 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 © BSI 12-1999i Contents Page National forewordInside front cover Introduction1 Section 1. General data 1.1Recommended method(s) of mounting3 1.2Dimensions, ratings and characteristics3 1.3Related documents3 1.4Marking3 1.5Ordering information3 1.6Certified records of released lots4 1.7Additional information (not for inspection purposes)4 1.8Increased severities or requirements which are additional to those specified in the generic and/or sectional specification4 Section 2. Inspection requirements 2.1Procedures4 Table I3 Table II4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 ii © BSI 12-1999 National foreword This Part of this British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with IEC Publication 115-2-1 (QC 40101): “Fixed resistors for use in electronic equipment. Blank detail specification: Fixed low power non-wirewound resistors. Assessment level E” published by the International Electrotechnical Committee (IEC). This standard is a harmonized specification within the IECQ system of quality assessment for electronic components. Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Cross-references. The British Standard harmonized with QC 001001 and QC 001002 is BS 9000 “General requirements for a system for electronic components of assessed quality” Part 1:1981 Specification of basic rules and procedures. In adopting the IEC text as a national standard it has been noted that there is an omission from boxes 2 and 4 of the specification number in the IEC quality Assessment System for Electronic Components (IECQ). This has been drawn to the attention of the IEC TC 40 Secretariat and the specification number has been inserted where necessary in this standard. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS 9940-01. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS 9000, the latter shall take precedence except that the front page layout will be in accordance with BS 9000 Circular Letter No 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International StandardCorresponding British Standard IEC 63:1963BS 2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment (Technically equivalent) IEC 115-1:1982 (QC 400000:1982) BS 9940: Fixed resistors for use in electronic equipment Part 0:1983 Generic specification (Identical) IEC 115-2:1982 (QC 400100:1982) BS 9940: Fixed resistors for use in electronic equipment Part 01:1983 Sectional specification: Fixed low power non-wirewound resistors (Identical) IEC 410:1973BS 6001:1972 Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 © BSI 12-19991 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail Specifications not complying with these requirements shall not be considered as being in accordance with IEC Specifications nor shall they be so described. In the preparation of detail specifications the content of Sub-clause 1.4 of the sectional specification shall be taken into account. The numbers between brackets on page 2 correspond to the following information which shall be inserted in the position indicated: Identification of the detail specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the resistor 5 A short description of the type of resistor. 6 Information on typical construction (when applicable). NOTEWhen the resistor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause 3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9 Reference data on the most important properties, to allow comparison between the various resistor types. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 2 © BSI 12-1999 1IEC 115-2-1-XXX (QC 400101-XXX) 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 115-2-1 (QC 400101) 4 3 FIXED LOW-POWER NON-WIREWOUND RESISTORS 5 Outline drawing: (see Table I) (First angle projection) 7 Insulated/non-insulated6 Assessment level(s): E8 (Other shapes are permitted within the dimensions given) Information on the availability of components qualified to this detail specification is given in the Qualified Products List. 9 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 © BSI 12-19993 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause 1.4.2 of IEC Publication 115-2.) 1.2 Dimensions, ratings and characteristics Table I 1.2.1 Derating Resistors covered by this specification are derated according to the following curve: (A suitable curve to be included in the detail specification) NOTESee also Sub-clause 2.2.3 of the sectional specification. 1.3 Related documents 1.4 Marking The marking of the component and package shall be in accordance with the requirements of IEC Publication 115-1, Sub-clause 2.4. NOTEThe details of the marking of the component and package shall be given in full in the detail specification. 1.5 Ordering information Orders for resistors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated resistance. Style Rated dissipation at 70 °C (W) Temperature coefficient µ or temperature characteristic (as applicable) Limiting element voltage (V d.c. or a.c. r.m.s.) Isolation voltage (V d.c. or a.c. peak) Maximum dimensions dnom.: Tol.:LD All dimensions are in millimetres or inches and millimetres. Resistance rangea. . . to . . . Tolerances on rated resistance. . . ±. . . % Climatic category/ Low air pressure8.5 kPa (85 mbar) Stability class. . . % Limits for change of resistance: for long-term tests±(. . . %R + . . . 7) for short-term tests±(. . . %R + . . . 7) Temperature characteristic of resistance (20 °C to upper category temperature) for carbon composition types. . . % Temperature coefficientµ: . . . 106/°C (for all other resistors) a The preferred values are those of the E-series of IEC Publication 63: Preferred Number Series for Resistors and Capacitors. Generic Specification:IEC Publication 115-1:1982: Fixed Resistors for Use in Electronic Equipment, Part 1: Generic Specification. Sectional Specification:IEC Publication 115-2:1982: Part 2: Sectional Specification: Fixed Low-power Non-wirewound Resistors. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 4 © BSI 12-1999 b) Tolerance on rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Increased severities or requirements which are additional to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval, the procedure shall be in accordance with the Sectional Specification, IEC Publication 115-2, Sub-clause 3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause 3.3.1 of the Sectional Specification. NOTEWhen drying is called for, Procedure I of Sub-clause 4.3 of the Generic Specification, IEC Publication 115-1, shall be used. Table II NOTE 1Sub-clause numbers of test and performance requirements refer to the Generic Specification, IEC Publication 115-1, except for resistance change requirements, which have to be selected from Table I and Table II of the sectional specification, as appropriate. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p= periodicity (in months) n= sample size c= acceptance criterion (permitted number of defectives) D= destructive ND= non-destructive IL= inspection level IEC Publication 410 AQL = acceptable quality level Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) ILAQLPerformance requirements (see Note 1) (see Note 2) Group A Inspection (lot-by-lot) Sub-group A1NDS-41.0 % 4.4.1Visual examinationAs in 4.4.1. Legible marking and as specified in 1.4 of this specification Sub-group A2NDS-41.0 % 4.4.2Dimensions A gauge-plate of . . . mm shall be used As specified in Table I of this specification (gauging) 4.5ResistanceAs in 4.5.2 Group B Inspection (lot-by-lot) Sub-group B1ND S-31.0 % 4.7Voltage proof (insulated resistors only) Method: . . .No breakdown or flashover Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 © BSI 12-19995 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) ILAQLPerformance requirements (see Note 1) (see Note 2) Sub-group B2DS-32.5 % 4.17 4.13 Solderability Overload Without ageing Method: . . . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within . . . s, as applicable Testa duration Rateda dissipation The applied voltage shall be 2.5 times the rated voltage or twice the limiting element voltage, whichever is the less severe Visual examination Resistance No visible damage Legible marking %R u ± (. . . %R + . . . 7) Sub-group B3ND 4.8.4.2 Temperature coefficient of resistance This test is applicable only when a temperature coefficient of resistance of less than ±50.106/°C is claimed. One cycle of 20 °C to 70 °C to 20 °C only µ: . . . 106/°C a See Sub-clause 2.3.4 of the sectional specification. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 6 © BSI 12-1999 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc Group C Inspection (periodic) Sub-group C1A Half of the sample of Sub-group C1 D 310 4.16 4.18 Robustness of terminations Resistance to soldering heat Tensile, bending and torsion tests as applicable Visual examination Resistance Method: . . . Visual examination Resistance No visible damage %R u ± (. . . %R + . . . 7) No visible damage Legible marking %R u ± (. . . %R + . . . 7) Sub-group C1B Other half of the sample of Sub-group C1 D310 4.19Rapid change of temperature ÚA = Lower category, temperature 4.22 Vibration ÚB = Upper category temperature Visual examination Resistance Method of mounting: see 1.1 of this specification Procedure: B4 Frequency range: 10 Hz to 500 Hz Amplitude: 0.75 mm or acceleration 98 m/s2 (whichever is the less severe) Total duration: 6 h Visual examination Resistance No visible damage %R u ± (. . . %R + . . . 7) No visible damage %R u ± (. . . %R + . . . 7) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:27:40 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-01.01:1983 © BSI 12-19997 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc Sub-group C1D3201 Combined sample of specimens of Sub-groups C1A and C1B 4.23Climatic sequence Dry heat Damp heat, cyclic, Test Db, first cycle Cold Low air pressure Damp heat, cyclic, Test Db, remaining cycles D.C. load 8.5 kPa (85 mbar) Visual examination Resistance Insulation resistance (Insulated resistors only) No visible damage Legible marking %R u ± (. . . %R + . . . 7) R W