ECA-162-1956-R1983.pdf

EIA STANDARD Test Standard for Ceramic Based Printed Circuits - RS-162 (Reaffirmed February 1970) August 1956 Engineering Department ELECTRONIC INDUSTRIES ASSOCIATION Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 20:17:22 MDTNo reproduction or networking permitted without license from IHS -,-,- *Y - 7 E I A l b 2 56 m 3234bOO 0028440 3 m NOTICE EIA engineering standards are designed to serve the public interest through eliminating mis- understandings between manufacturers and purchasers, facilitating interchangeability and improve- ment of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such standards shall not in any respect pre- clude any member or non-member of EIA from manufacturing or selling products not conforming to such standards, nor shall the existence of such standards preclude their voluntary use by those other than EIA members whether the standard is to be used either domestically or internationally. Recommended standards are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the recommended standards. Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, N.W., Washington, D . C. 20006 Electronic Industries Association 1970 All rights reserved PRICE 6 O c Printed i n U.S.A. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 20:17:22 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A lb2 56 3234600 0028443 5 RS-162 Page 1 TEST STANDARD FOR CERAMIC BASED PRINTED CIRCUITS (Reaffirmation of RS-1621 1. SCOPE This standard describes the standard test procedures to be used for ceramic based printed circuits. It specifically covers the type A unit, but may be used as far as applicable for type B units, as defined below. Unit Standards for Ceramic Based Printed Circuits may be found in EIA Standard RS-16 1. 2. TYPES 2.1 the terminations for individual measurement. Type A is a combination in which the components are separably and individually accessible at 2.2 Type B is a combination in which some of the components are not separably and individually accessible at the terminations for individual measurement, and which, in part or whole, must be considered as circuits. 3. MARKING Marking will include a symbol which designates the number of lead wires and the type of circuit. It shall also include manufacturers identification on the same side of the unit. Where specified in the unit standards, numbering of lead wires shall be on the same face. 3.1 The part number consists of four parts: 3.1.1 A number designating the number of lead wires, 3.1.2 The letters PZ which designate a printed circuit, 3.1.3 A number which indicates the circuit within the family of printed circuits with the same number of lead wires and, 3.1.4 A letter indicating a revision, for example, 3PZ2A indicates a printed circuit with three lead wires. It is the second of the family of printed circuits with three lead wires and has been revised once. 4. INITIAL TESTS Test conditions, unless otherwise specified, shall be made at or referred to 25°C. and a relative humidity no greater than 70%. 4.1 Resistance Measurement Resistance shall be measured by appiication of dc voltage in accordance with the following table in a Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 20:17:22 MDTNo reproduction or networking permitted without license from IHS -,-,- RS-162 Page 2 E I A Lb2 5b 323Ltb00 00284Lt2 7 M E . i Wheatstone bridge circuit of at least .5% accuracy, Voltage shall be applied for as short a time as is practicable in order that the temperature of the resistor shall not rise appreciably during the measurement. 4 Resistance-Test Voltage Resistance (nominal ohms) 1-10“ 1 o- 100“ 100-1,000“ 1,000-10,000“ 10,000-100,000“ 100,000 and over Test Potential (volts) 0.3 1 .o 3.0 10 30 1 00 *but not including 4.2 Capacitance Measurement Capacitance shall be measured with an RMS voltage between 0.5 and 5.0 volts at a frequency of 1 kHz. Values of 1,000 PF or less shall be read at either 1 kHz or 1 MHz. 1 MHz shall be used where it is needed to exclude the effect of shunting resistors. 4.3 Q or power factor measurements shall be made under the same conditions as capacitance measurement. Q or Power Factor Measurement 4 4.4 Measurement of Insulation Resistance Between Capacitor Terminals Or Any Pair of Non-Con- nected Terminals Insulation resistance between capacitor terminals shall be measured one minute after application of dc test voltage not to exceed rated or 500 volts whichever is less. A protective resistor shall be used to limit the current to a maximum of .O50 ampere. 4.5 Dielectric Test of Capacitors Capacitors shall be tested without breakdown or arc-over for not less than one second with a dc test voltage of twice the rated working voltage of the capacitor through a protective resistor to limit charging current to a maximum of .O50 ampere. (Care shall be taken to test only those circuits where resistors will not be damaged by this test.) 4.6 Capacitors shall be tested without breakdown or arc-over for one second at 1300VDC applied between both leads connected together and a metal foil wrapped closely around the body of the unit to within no less than .062“ (1.587 mm) of the lead wires. Voltage shall be applied through a protective resistor to limit the charging current to a maximum of .O50 ampere. Dielectric Test of Body Insulation a Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 20:17:22 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A l b 2 56 3234600 0028443 7 Ra-162 Page 3 5. QUALIFICATION TESTS 5.1 Resistors 5.1.1 Normal Load Test All resistors shall be simultaneously load tested at 40°C. +3“C. and at their recommended maximum continuous dc working voltage, or at the voltage which results in nominal rated power dissipation, whichever is lower. The test voltage shall be applied for 1% hours on and ?h hour off for a total time of 500 hours. Resistance determinations shall be made initially and at the end of the first half-hour off period after 200 and 500 hours of test. 5.1.2 Humidity The humidity test shall consist of exposure for 200 hours to 90% to 95% relative humidity and an ambient temperature of 40°C. +3“C. without application of voltage. After humidity exposure, samples shall be conditioned for 1 hour at 10% to 50% relative humidity at 25°C. +3“C. Resistance values shall be read immediately before humidity exposure and immediately after 1 hour conditioning. 5.1.3 Resistance Temperature Characteristic The resistance temperature characteristic shall be expressed as the average per cent change between 25°C. and 85°C. 5.1.4 Voltage Coefficient Voltage coefficient shall be expressed as per cent change in resistance per unit of applied voltage between 1/10 rated voltage and maximum rated voltage. Voltage shall be applied for as short a time as is practicable in order that the temperature of the resistor shall not rise appreciably during the measurement. 1 ). 100 - Rmax. - R.I ma.)(., R “ ë ( R.1 max . - E.1 max. 5.2 Capacitors 5.2.1 Temperature Characterìstic Capacitance variance with temperature shall be determined in a single run from +lO“C. to +75“C. or -55°C. to +85“C. as applicable and shall be expressed as the maximum capacitance increase and maximum capacitance decrease from the value at 25°C. 53°C. 5.2.2 Humidity Test The humidity test shall consist of exposure for 200 hours to 90% to 95% relative humidity and an ambient temperature of 40°C. +3“C. without application of voltage. After humidity exposure test samples shaii be conditioned for 1 hour at 10% to 50% relative humidity and 25°C. +3“C. Capacitance, Q, and insulation resistance readings shall be taken immediately before humidity Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 20:17:22 MDTNo reproduction or networking permitted without license from IHS -,-,- : c_z E I A Lb2 56 W -3234600 0028444 O RS-162 Page 4 a exposure and immediately after 1 hour conditioning at 10% to 50% relative humidity at 25OC. rr3“c. 5.2.3 Load Life Test All capacitors shall simultaneously be subjected to a dc voltage of twice the rated working value for 250 hours at 85°C. +3“C. Capacitors shail be tested immediately before and 24 hours after this test for capacitance, Q, and insulation resistance. 6. ORDER OF TESTS 6.1 Tests shall be run in the following order: (all samples) 6.1.1 6.1.2 6.1.3 6.1.4 6.1.5 6.2 Prior Visual and mechanical inspection, etc. Resistance Capacitance Power factor Voltage Breakdown to the next test the samples shall be divided into three equal groups. Units shall be conditioned for 24 hours at 25°C. f 3°C. and at 10% to 50% relative humidity. 6.2.1 Group I a. Insulation Resistance b. Resistor and Capacitor Humidity (Oniy one exposure) 6.2.2 Group II a. Dielectric test of body insulation b. Resistor voltage coefficient c. Resistor load life 6.2.3 Group III a. Resistance temperature characteristic b. Capacitor temperature characteristic c. Capacitor load life Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 20:17:22 MDTNo reproduction or networking permitted without license from IHS -,-,-