JIS-C-2525-1999-R2005-ENG.pdf

J IS JAPANESE I N DUSTR IAL STA N D A R D Translated and Published by Ja pa nese Sta nda rds Association JIS C 2 5 2 5 1 9 9 9 Testing method for conductor= resistance and resistivity of metallic resistance materials ICs 29.050 Descriptors : electrical resistance, electrical properties of materials, resistors, electric conductors, electrical components, electrical resistivity, dielectric-strength tests, dielectric strength, electrical testing, metals Reference number : JIS C 2525 : 1999 (E) 7s Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:44:46 MDTNo reproduction or networking permitted without license from IHS -,-,- C 2525 : 1999 Foreword This translation has been made based on the original Japanese Industrial Standard revised by the Minister of International Trade and Industry through deliberations at Japanese Industrial Standards Committee in accordance with the Industrial Standardization Law. Consequently JIS C 2525 : 1994 is replaced with JI$ C 2525 : 1999. Date of Establishment: 1953-08-21 Date of Revision: 1999-07-20 Date of Public Notice in Official Gazette: 1999-07-21 Investigated by: Japanese Industrial Standards Committee Divisional Council on Electricity JIS C 2525 : 1999, First English edition published in 2000-06 Translated and published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. ic O JSA 2000 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:44:46 MDTNo reproduction or networking permitted without license from IHS -,-,- STD=JIS C 2525-ENGL 1999 4933b08 05b372b 427 W JAPANESE INDUSTRIAL STANDARD JIS C 2525 : 1999 Testing method for conductor-resistance and resistivity of metallic resistance materials II . Introduction This Japanese Industrial Standard has been prepared by revising JIS C 2525 : 1994, using IEC 60468, Method of measurement of resistivity ofmetal- lic materials published in 1974 as the informative reference and taking recent progress in measurement technique into consideration. 1 Scope This Japanese Industrial Standard specifies the testing method for the conductor-resistance and volume resistivity of metallic resistance materials and the like with resistivities between 0.05 pQm and 2 pQm. 2 Normative references The following standards contain provisions which, through reference in this Standard, constitute provisions of this Standard. The most recent editions of the standards indicated below shall be applied. Rules for rounding off of numerical values Standard atmospheric conditions for testing JIS Z 8401 JIS Z 8703 3 Definitions For the purpose of this Standard the following principal definitions apply: metallic resistance material A metallic conductive material of which the elec- tric resistance characteristics are utilized. conductor-resistance The electric resistance (Q) per unit length of an elec- trical conductor having uniform cross-sectional area. In general, it means elec- tric resistance per meter (am) or electric resistance per kilometer (Wkm). Symbol of conductor-resistance: RC volume resistivity The electric resistance per unit cross-sectional area and unit length (Qm). It is sometimes simply called “resistivity“. Symbols of vol- ume resistivity are as given below: Symbol of volume resistivity: p Symbol of volume resistivity at temperature t O C : pt voltage terminals Knife-form metals which serve as test piece holding jigs to be used for measuring the voltage difference between both ends of the test piece. current terminals Screw-fixing type metals which serve as test piece hold- ing jigs to be used when a current is passed through the test piece. measuring conductors The conductive wires which connect the voltage ter- minals and current terminals, with the measuring instrument and electric power supply- over-all uncertainty The uncertainty in the measurement where the confï- dence limits are expected to have a high confidence level (Pl. Here, P = 95 % is used. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:44:46 MDTNo reproduction or networking permitted without license from IHS -,-,- STD-JIS C 2525-ENGL 1999 = 4733608 0563727 363 Form of product Wire Bar strip Sheet Wire under 0.1 mm in diameter strip 01 Sheet under 0.5 mm in thidmess 2 C 2525 : 1999 Sampling method The specified number of pieces taken from the product shall be used as test pieces as they are. Wires 0.5 mm to 1.0 mm in diameter, or strips or sheets 0.5 mm to 1.0 mm in thickness shall be prepared from the intermediate process of the same melting unit as that of the product and be used as test pieces. Where it is difficult to take test pieces from the intermediate process of the same melting unit, the cross-sectional area of the test piece shall be found in accordance with 7 . 1 b) and the product as it is may be used as the test piece. 4 Test piece 4.1 Sampling method of test piece Test pieces shall be taken as shown in Table 1. Wire or bar 0.1 mm or more in diameter strip O r sheet 0.5 mm O r more in thidmess Test piece Test piece for measuring conductor- resistance Test piece for measuring volume If test pieces of 0.01 Q or more can be obtained, the test pieces for measuring conductor-resistance shall be used as they are. Where the resistance is under 0.01 Q, the product, if in the form of wire or bar, shall further be drawn, and if in the form of strip or sheet, shall be cut into the form of ribbons of uniform width, and used as test pieces. Where there is a difficulty, a wire or bar, or strip or sheet shall be separately prepared from the intermediate process of the same melting unit and test pieces of 0.01 i 2 or more shall be prepared. resistivity Table 1 Sampling method of test piece 4.2 Method of conditioning test piece Test pieces shall be conditioned as fol- lows: a) The product as finished shall be used for the test pieces for conductor-resis- tance and volume resistivity. The test pieces prepared for volume resistivity measurement separately from the product shall be annealed by a method suit- able for respective materials. For the test pieces prepared by cutting, the strain produced by cutting shall be removed. b) Where the surfaces of test pieces are covered with an oxide film or insulation covering, the film or covering at the area where the test piece is contacting with the measuring terminals shall be removed to expose the metal surface. No unnecessary tension or bending shall be exerted on the test pieces taken. They shall be handled carefully to prevent stains and dust from attaching to them. c) 8 Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:44:46 MDTNo reproduction or networking permitted without license from IHS -,-,- STD-JIS C 2525-ENGL 1999 4933b08 0563728 2TT E 3 C 2525 : 1999 d) The test piece of nickel chromium heating material may be subjected to such heat treatment, if the user requires heat treatment, that the material is main- tained at approximately 800 “C for 30 min and then cooled by air (since nickel chromium heating material reduces its resistance by several percent when rap- idly cooled in finishing annealing). 4.3 The dimensions of test pieces shall, as a rule, be large enough to provide a measuring length of 50 cm or larger. In the case of test pieces for volume resistivity measurement, there shall not be a variation of 1 % or more in diameter, and 3 % or more in width and thickness through the overall length of the test piece. Dimensions of test piece 5 Test conditions 5 . 1 The test shall be carried out at the standard temperature (231 3) “C specified in JIS Z 8703. When the testing temperature is different from the above, calculation shall be carried out on the data corrected. Temperature of testing site 5.2 Measuring current Where there is possibility of change in resistance value of 0.1 % or more as a result of self-heating of the test piece by the measuring cur- rent, the resistance shall be measured at the initial current and at the current cor- responding to + s,' + s; + . +a; /3 + a 3 3 + . + (U/2)* Over-all uncertainty The value of confidence limit at which maintenance of high confidence level is expected (K = 2 for 95 % confidence level) U = Ku, (y) Coverage factor k Numerical factor used as a multiplier of the combined stan- dard uncertainty in order to obtain the over-all uncertainty. In the case of indirect measurement, rss system is applied but when there is cor- relation between the measurands, the correlation shall be taken into consideration. In this Standard the over-all uncertainty (K = 2, confidence level: 95 %) is used. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:44:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:44:46 MDTNo reproduction or networking permitted without license from IHS -,-,-