JIS-B-0659-1-2002-R2007-ENG.pdf

J IS JAPANESE INDUSTRIAL STANDARD Translated and Published by Japanese Standards Association JIS B 0659-1 2002 Geometrical Product Specifications (G PS)-Su rface text Ure : Prof i le method ; Measurement standards- Part 1 : Material measures ICs 17.040.20; 17.040.30 Reference number : JIS B 0659-1 : 2002 (E) PROTECTED BY COPYRIGHT 14 S Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/16/2007 00:42:42 MDTNo reproduction or networking permitted without license from IHS -,-,- B 0659-1 2002 Foreword This translation has been made based on the original Japanese Industrial Standard established by the Minister of Economy, Trade and Industry through deliberations at the Japanese Industrial Standards Committee according to the proposal of revising a Japanese Industrial Standard from the Japanese Standards Association (JSA), with a draft of Industrial Standard based on the provision of Article 12 Clause 1 of the Industrial Standardization Law. Since the original International Standard does not contain the items concerning the roughness comparison specimens, part of the former standard, JIS B 0659 : 1996 is modified and described in Annex 1 as an informative reference. JIS B 0659 consists of the following two parts. JIS B 0659-1 Geometrical Product Specifications (GPS)-Surface texture : Profile method ; Measurement standards- Part 1 : Material measures JIS B 0659-2 Geometrical Product Specifications (GPS)-Surface texture : Profile method ; Measurement standards- Part 2 : Software measurement standards (to be published) Date of Establishment: 2002-03-20 Date of Public Notice in Official Gazette: 2002-03-20 Investigated by: Japanese Industrial Standards Committee Standards Board Technical Committee on Machine Elements JIS 3 0659-1 : 2002, First English edition published in 2003-01 Translated and published by: Japanese Standards Association 4-1-24, Akacaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. O JSA2003 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/16/2007 00:42:42 MDTNo reproduction or networking permitted without license from IHS -,-,- B 0659-1 : 2002 Contents Page 1 1 2 2 3 3 3 3 3 3 3 4 4 5 5 5 6 7 8 9 10 10 10 11 11 Introduction . 1 2 3 4 4.1 4.2 5 5.1 5.2 5.3 5.4 5.5 5.6 6 6.1 6.2 6.3 6.4 6.5 7 7.1 7.2 7.3 7.4 Scope Normative references Terms and definitions . Design requirements for measurement standards Material . Size of measurement standard Types, purposes and metrological characteristics of measurement standards General Type A-Depth measurement standard . Type B-Tip condition measurement standard Type C-Spacing measurement standard Type D-Roughness measurement standard Type E-Profile coordinate measurement standard Measurement standard requirements Type A-Depth measurement standard . Type B-Tip condition measurement standard Type C-Spacing measurement standard Type D-Roughness measurement standard Type E-Profile coordinate measurement st andard Definition of the measurands for the measurement standards Type Al Type A2 Type B2 . Type B3 PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/16/2007 00:42:42 MDTNo reproduction or networking permitted without license from IHS -,-,- B 0659-1 : 2002 7.5 Types C1 to C4. and D . 7.6 TypeEl 7.7 Type E2 8 Measurement standard certificate . Annex A (informative) Annex B (informative) Annex 1 (informative) Annex 2 (informative) Relation to the GPS matrix model Bibliography Roughness comparison specimens . Comparison table between JIS and corresponding International Standard . 12 12 12 13 14 15 16 19 (ii) PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/16/2007 00:42:42 MDTNo reproduction or networking permitted without license from IHS -,-,- JAPANESE INDUSTRIAL STANDARD JIS B 0659-1 : 2002 Geometrical Product Specifications (GPS)- Surface texture : Profile method ; Measurement standards- Part 1 : Material measures Introduction This Japanese Industrial Standard has been prepared based on the first edition of IS0 5436-1 Geometrical Product Specifications (GPS)-Surface tex- ture : Profile method ; Measurement standards-Part 1 : Material measures published in 2000 with some modifications of the technical contents. This Standard is part of the Geometrical Product Specifications (GPS), is to be regarded as a general GPS standard (see TR B 00071, and influences chain link 6 of the chain of standards on roughness curve, waviness curve and primary profile. For more detailed information of the relation of this Standard to other GPS stan- dards, see Annex A. This Standard introduces new measurement standards, namely type E, to cali- brate the profile co-ordinate system. The original International Standard does not contain the items concerning the roughness comparison specimens, and part of the former standard, JIS B 0659 : 1996 is modified and described in Annex 1 as information. The portions with sidelines or underlines with dots in this Standard are the mat- ters in which the original International Standard has been modified. Remarks : “Measurement standards” were formerly referred to as “calibration specimens”. 1 Scope This Standard specifies the characteristics of material measures used as measurement standards (etalons) for the calibration of metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in JIS B 0651. Remarks : The International Standard corresponding to this Standard is as fol- lows. In addition, symbols which denote the degree of correspondence in the contents between the relevant International Standard and JIS are IDT (identical), MOD (modified), and NEQ (not equivalent) ac- cording to ISO/IEC Guide 21. IS0 5436-1 : 2000 Geometrical Product Specifications (GPS)-Surface texture : Profile method ; Measurement stundards- Part 1 : Material measures (MOD) Etalon is a measuring instrument, material measure, reference ma- teria1 or measuring system, intended to define, realize, conserve or reproduce a value of a unit or quantity, to serve as a reference (JIS Z 8103). Information : _._._._-.-.-.-_._._ _._._. ? ._._._._. * ._._._ _._ _ _._._._._ _._ *._._._._._._ ._._._ ._ _._ . . . . . . . . . . . . . . . . . . . . . . . . . . . PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/16/2007 00:42:42 MDTNo reproduction or networking permitted without license from IHS -,-,- 2 B 0659-1 : 2002 2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this Standard. For dated references, subsequent amendments to, or revisions of, any of these publica- tions do not apply. For undated references, the latest edition of the normative document referred to applies. JIS B 0601 Remarks : JIS B 0631 Remarks : JIS B 0633 Remarks : JIS B 0651 Remarks : JIS Z 8103 Geometrical Product Specification (GPS)-Surface texture : Profile method-Terms, definitions and surface texture parameters IS0 4287 : 1997 Geometrical Product Specifications (GPS)-Surface texture : Profile method-Terms, definitions and surface texture param- eters is identical with the said standard. Geometrical Product Specification (GPS)-Surface texture : Profile method-Motif parameters IS0 12085 : 1996 Geometrical Product Specifications (GPS)-Surface texture : Profile method-Motif parameters is identical with the said standard. Geometrical Product Specification (GPS)-Surface texture : Profile method-Rules and procedures for the assessment of surface texture IS0 4288 : 1996 Geometrical Product Specifications (GPS)-Surface texture :Profile method-Rules and procedures for the assessment of surface texture is identical with the said standard. Geometrical Product Specification (GPS)-Surface texture : Profile method-Nominal characteristics of contact (stylus) instruments IS0 3274 : 1996 Geometrical Product Specifications (GPS)-Surface texture : Profile method-Nominal characteristics of contact (sty1 us) instruments is identical with the said standard. Glossary of terms used in measurement Information : The terms used in measurement of this Standard is based on the definitions of JIS Z 8103, and therefore the said standard is added to the normative reference of this Standard. IS0 10012-1 : 1992 Quality assurance requirements for measuring equipment- Part 1 : Metrological confirmation system for measuring equip- ment ISOITS 14253-2 : 1999 Geometrical Product Specifications (GPS)-Inspection by measurement of workpieces and measuring equipment- Part 2 : Guide to the estimation of uncertainty of GPS measurement, in calibration of measuring equipment and in product verification Guide to the expression of uncertainty in measurement (GUM), BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, 1993 . 3 Terms and definitions For the purposes of this Standard the terms and defi- nitions given in JI$ I 3 0601, JIS B 0651 and JIS ._._. Z 8103 apply. PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/16/2007 00:42:42 MDTNo reproduction or networking permitted without license from IHS -,-,- 3 B 0659-1 : 2002 4 Design requirements for measurement standards 4.1 Material The material used for measurement standards type A to type E shall be hard enough to ensure adequate life in relation to cost (manufacturing and cali- bration). Its surface shall be smooth and flat enough not to affect the evaluation. 4.2 The measurement window shall be large enough to provide for the total length of traverse required for all in.tended determi- nations. The measurement window consists of that region of the total surface over which calibration measurements are made. One or more kinds of measurement stan- dards may be provided on a single block. To ensure the best possible economic con- ditions, overall dimensions of measurement standards are not given. Size of measurement standard 5 Types, purposes and metrological characteristics of measurement stan- dards 5.1 General The calibration of the existing wide range of instruments in all modes of operation calls for more than one type of measurement standard. Each measure- ment standard may have a limited range of application according to its own charac- teristics and those of the instrument to be calibrated. The validity of the calibration of an instrument will be dependent on the correct association of these characteris- tics. To cover the range of requirements, five types of measurement standards are de- scribed, each of which may have a number of variants (see Table l). Table 1 Types and names of measurement standards Name Depth measurement standard Tip condition measurement standard Spacing measurement standard Roughness measurement standard Profile coordinate measurement standard I I I 5.2 Type A-Depth measurement standard These measurement standards are for calibrating the vertical profile component of stylus instruments. 5.2.1 Type Al-Wide grooves with flat bottoms These measurement standards have a wide calibrated groove with a flat bottom, a ridge with a flat top, or a num- ber of such separated features of equal or increasing depth or height. Each feature is wide enough to be insensitive to the shape or condition of the stylus tip (see Fig- ure i). 5.2.2 Type A2Wide grooves with rounded bottoms These measurement stan- dards are similar to type Al, except that the grooves have rounded bottoms of suffi- cient radius to be insensitive to the shape or condition of the stylus tip (see Figure 2). 5.3 Type B-Tip condition measurement standard These measurement stan- dards are primarily for calibrating the condition of the stylus tip. PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/16/2007 00:42:42 MDTNo reproduction or networking permitted without license from IHS -,-,- 4 B 0659-1 : 2002 5 . 3 . 1 Type B1 These measurement standards have a narrow groove or a number of separated grooves proportioned to be increasingly sensitive to the dimensions of the stylus tip. The narrow grooves have rounded bottoms of sufficient radius to be sensitive to the shape or condition of the stylus tip. 5.3.2 Type B2 These measurement standards have two groove patterns of nomi- nally equal Ra (arithmetical mean roughness) values, one being sensitive and the other insensitive to the dimensions of the stylus tip (see Figures 3 and 4 ) . 5 . 3 . 3 Type B3 These measurement standards have a fine protruding edge. Un- coated razor.blades, for example, have edge widths of approximately 0.1 Fm or less. The stylus condition may be assessed by traversing such a specimen and recording the surface profile. Information : The edge width shall be measured according to Informative Figure 1, Edge width 0.1 pm or less Informative Figure 1 Edge width of razor blade 5 . 4 Type C-Spacing measurement standard These measurement standards are used primarily for calibrating horizontal profile components. They may also be used for calibrating vertical profile components if the spacing of the grooves is as accurate as depth measurement standard. The purpose of the series of type C mea- surement standards is to enable the transmission characteristics to be checked for a number of spacings and amplitudes. They have a grid of repetitive grooves of simple shape (either sinusoidal, trian- gular or arcuate). An essential requirement of type C measurement standards is that standardized measurement standards of differing waveform are nevertheless com